Are MSER features really interesting?

Kimmel, R.; Zhang, C.; Bronstein, A. M.; Bronstein, Michael
Research areas:
Year:
2011
Type of Publication:
Article
Keywords:
feature descriptor, MSER, affine invariance
Journal:
IEEE Trans. Pattern Analysis and Machine Intelligence (PAMI)
Volume:
33
Number:
11
Pages:
2316-2320
Hits: 1062

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